Aeonic Insight™ PDN IQ
The Aeonic Insight™ PDN IQ transforms power delivery network characterization and testing by delivering transistor-level PDN visibility and telemetry at the nanosecond scale. The telemetry provided can be applied across the silicon lifecycle to optimize power, performance, and in-field uptime.
The PDN IQ platform introduces an industry-first, in-situ PDN trace capability for the merchant semiconductor market. Combined with sophisticated trigger mechanisms, this allows the capture and storage of the voltage waveforms that are augmented by the on-board analytics to provide powerful insights for the SoC PDN.
Learn More
Use Cases
V-F Optimization
The Aeonic Insight™ PDN IQ enables precise calibration of the V-F curves during characterization to improve power and performance by providing transistor-level visibility. With this visibility, post-silicon bring-up and test teams can confidently set their V-F pairs.
Reducing DPPM Rates
PDN IQ allows test teams to utilize on-board analytics, including di/dt profiles, to detect and analyze behavior during ATE characterization. It also helps establish pass/fail criteria for volume production screening. These features can enhance DPPM rates by minimizing false negatives and improving yields by decreasing false positives.
Chiplets V-F Curve
Chiplets and 3DICs face added PDN complexity due to system intricacies (multiple die, interposers, TSVs) and manufacturing variability, leading to non-uniform PDN behavior. PDN IQ allows V-F curve calibration at the package and die levels. It also serves as a crucial debugging tool for power delivery issues, which is essential in chiplets and 3DICs.
Uptime Optimization
PDN IQ allows “large fleet managers” (e.g. hyperscalar training clusters) to benchmark voltage excursions occurring in the field against production screening watermarks. As a result, teams can monitor systems both in real-time and offline (e.g. during maintenance stress tests).
Product Highlights
Trace
Industry-first, in-situ PDN trace capture for transient voltage waveforms
Visibility
Transistor-level voltage visibility at the nanosecond scale
PDN Telemetry
Suite of on-board PDN-focused telemetry for use across the silicon lifecycle (e.g. characterization, production screening, and in-field).
Patent Notice may be found at: www.movellus.com/patent-notice.
