Bench-to-in-field
PDN telemetry
for datacenter power.

Automated Vmin sensing platform for silicon and workload characterization. Nanosecond, near-transistor measurement, bench to in-field.

Monitor real-time transient voltage events

Near-transistor voltage readings across the device

Bench to in-field, one platform for voltage telemetry

Margins vary from bench to field.

Power management is a continuous cycle, and most of it happens on the bench before silicon ships. But a new frontier model drops in months while silicon takes years. Solely relying on bench characterization is no longer an option.

On the bench, today

What you see is not what the transistor sees

• Monitoring at the VRM level samples at microsecond intervals, three orders of magnitude slower than the voltage transients on die.
• Manual Vmin/Vmax sweeps across regions and workloads are iterative and tedious.
• GPUs ship with ~20% guardband, leaving up to 25% of energy on the table [1].

In the field, today

Your margins are set and frozen the day silicon ships

• Re-characterization requires silicon teams to go back to the bench.
• Frontier models refreshes in months, silicon in years.
• Silicon teams respond by sizing margins conservatively or disabling advanced power management like DVFS and thermal throttling.

Citations & References

1. J. Leng, A. Buyuktosunoglu, R. Bertran, P. Bose, Y. Zu, and V. J. Reddi, "Predictive Guardbanding: Program-Driven Timing Margin Reduction for GPUs," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021.

Aeonic Insight™ PDNIQ 2

One engine. Two readers.

PDNIQ 2 is a bench-to-in-field telemetry platform built on on-die Vmin sensing. The same on-die sensors capture voltage at a nanosecond resolution and near-transistor granularity. PDNIQ 2 turns that stream into what each team needs: characterization data for the post-silicon engineer on the bench, and live telemetry for deployment.

• PDNIQ 2
• On-die voltage sampling at nanosecond resolution, near-transistor granularity
• Bench Characterization
• V-F grid, regions × workloads
• Droop-slope waveforms
• Per-region histograms
• In-field telemetry
• Recharacterize for new workloads
• In-field analytics for unexpected PDN behavior
• Dynamic VRM setpoint adjustment

Actionable Intelligence
Across the System Lifecycle

From Silicon Bring-Up to Mission Mode

PDNIQ 2 provides critical telemetry data at every stage. See how our technology transforms both bench characterization and in-field monitoring.

Bench Characterization

Eliminate Blind Spots During Bring-Up

PDNIQ 2 turns bench V-F characterization into a telemetry stream. Hardware-automated Vmin search captures voltage at a nanosecond resolution, transient slew rate, depth, and recovery across every region of the die. Per-region histograms and digitized waveforms let post-silicon teams establish VRM setpoint against the voltage the logic actually saw, not reading at the package.

• Spatially and temporally dense V-F grid across workloads
• Per-region voltage histograms
• Digitized transient waveforms with slew rate, depth, recovery

Demonstration of PDNIQ 2 capturing a nanosecond-scale voltage droop during a high-current step load test.

In-Field Monitoring

Proactive Health and Performance Tracking

Continuous mission-mode observability ensures your silicon operates safely and efficiently throughout its lifecycle. Monitor established workloads, detect anomalous workloads, identify on-PDN weaknesses.

• Continuous mission-mode telemetry without performance overhead
• Detect anomalous power events and dynamic workload spikes
• Re-characterize silicon in the field with new workloads

Live dashboard view of PDNIQ 2 monitoring power grid health across a multi-core SoC during dynamic AI workloads.

Go deeper on PDNIQ 2

Two articles from the Movellus team on how on-die Vmin sensing changes bench characterization and in-field telemetry.

Ready to Eliminate the
Visibility Gap?

Integrate PDNIQ 2 into your next-generation silicon. Reclaim trapped performance, optimize power efficiency, and ensure mission-mode reliability.