Reduce DPPM 

Are false positives and false negatives in your ATE and SLT screening driving up costs and DPPM rates? The problem often lies in the disconnect between the test environment and a real-world system. The Power Delivery Network (PDN) on Automatic Test Equipment (ATE) is fundamentally different from a customer’s system, and at-speed SCAN patterns can create unrealistic current spikes ($di/dt$ events) that lead to inaccurate results.

This guesswork results in throwing away good parts or shipping faulty ones.

In this video, we explain how to solve this challenge by using Movellus’s Aeonic Insight PDN IQ to get a “golden measurement” of the on-die voltage at the transistor (VTransistor). By monitoring transient voltage events with nanosecond resolution, you can create a consistent baseline across ATE, SLT, and customer systems to reliably screen for outliers.